SOLUTE-ATOM SEGREGATION AND TWO-DIMENSIONAL PHASE TRANSITIONS IN STACKING FAULTS : AN ATOM-PROBE FIELD-ION MICROSCOPE STUDY
نویسندگان
چکیده
منابع مشابه
A Time-of-flight Atom-probe Field-ion Microscope for the Study of Defects in Metals
An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of ...
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ژورنال
عنوان ژورنال: Le Journal de Physique Colloques
سال: 1985
ISSN: 0449-1947
DOI: 10.1051/jphyscol:1985450